1

Properties of Ni1−xFex (0.1 

Ibro Tabakovic, Venkateswara Inturi, Jeremy Thurn, Mark Kief
Journal:
Electrochimica Acta
Year:
2010
Language:
english
File:
PDF, 457 KB
english, 2010
2

Erratum to “Properties of Ni1−xFex (0.1 

Ibro Tabakovic, Venkateswara Inturi, Jeremy Thurn, Mark Kief
Journal:
Electrochimica Acta
Year:
2011
Language:
english
File:
PDF, 108 KB
english, 2011
3

Thermal stress hysteresis and stress relaxation in an epoxy film

Jeremy Thurn, Theresa Hermel-Davidock
Journal:
Journal of Materials Science
Year:
2007
Language:
english
File:
PDF, 233 KB
english, 2007
4

Stable dielectric fracture at interconnects from electromigration stresses

Robert F. Cook, Jeremy Thurn
Journal:
Acta Materialia
Year:
2002
Language:
english
File:
PDF, 212 KB
english, 2002
7

Application of a physically consistent theory of brittle fracture

Thurn, Jeremy, Cook, Robert F.
Journal:
Philosophical Magazine A
Year:
2002
Language:
english
File:
PDF, 783 KB
english, 2002
13

Simplified Area Function for Sharp Indenter Tips in Depth-sensing Indentation

Thurn, Jeremy, Cook, Robert F.
Journal:
Journal of Materials Research
Year:
2002
Language:
english
File:
PDF, 167 KB
english, 2002
14

Indentation-induced deformation at ultramicroscopic and macroscopic contacts

Thurn, Jeremy, Cook, Robert F.
Journal:
Journal of Materials Research
Year:
2004
Language:
english
File:
PDF, 291 KB
english, 2004
15

Depth-sensing indentation at macroscopic dimensions

Thurn, Jeremy, Morris, Dylan J., Cook, Robert F.
Journal:
Journal of Materials Research
Year:
2002
Language:
english
File:
PDF, 299 KB
english, 2002
16

Toughness and Contact Behavior of Conventional and Low- k Dielectric Thin Films

Cook, Robert F., Morris, Dylan J., Thurn, Jeremy
Journal:
MRS Proceedings
Year:
2003
Language:
english
File:
PDF, 117 KB
english, 2003
18

Indentation-induced deformation at ultramicroscopic and macroscopic contacts

Thurn, Jeremy, Cook, Robert F.
Journal:
Journal of Materials Research
Year:
2004
Language:
english
File:
PDF, 284 KB
english, 2004